How are the gate charge parameters of WUXI NCE POWER chips measured?

Measuring the gate charge parameters of WUXI NCE POWER chips can usually be done using the following methods and steps:

Prepare the test equipment:

Semiconductor parameter analyzer: such as Keysight B1500A, etc., with the ability to accurately measure parameters such as voltage, current and capacitance, which can meet the requirements of gate charge measurement.

Suitable test fixture: Ensure good contact with the chip pins to reduce measurement errors and signal interference, and the corresponding fixture can be selected according to the chip package type.

Set the test conditions:

Gate Voltage Range: Determine the measurement range of gate voltage according to the chip specification, generally starting from 0V and gradually increase to the rated gate voltage, for example, from 0V to 10V (the specific value depends on the chip).

Drain current: set the appropriate drain current, usually for the chip's normal operation of the typical current value, but be careful not to exceed the maximum allowable current of the chip, so as not to damage the chip.

Test Frequency: Choose the appropriate test frequency, generally between a few hundred Hertz to thousands of Hertz, too high a frequency may lead to inaccurate measurement results, too low will increase the test time.

Connect the test circuit:

Install the WUXI NCE POWER chip on the test fixture correctly and connect the fixture with the semiconductor parameter analyzer to ensure reliable connection and good contact.

Connect the gate, drain, source and other pins of the chip to the corresponding test channel correctly according to the instructions of the test equipment.

Perform the measurement:

Start the Semiconductor Parameter Analyzer to begin measuring the gate charge parameters.

The device will gradually increase the gate voltage within the set gate voltage range and measure the corresponding gate current and gate capacitance and other data.

By analyzing and calculating the measured data, the curve of gate charge change with gate voltage is obtained, i.e. the gate charge characteristic curve.

Data processing and analysis:

From the obtained gate charge characteristic curve, you can read the value of gate charge under a specific gate voltage, such as the gate charge parameter when the common gate voltage is 4.5V or 10V.

Analyze whether the gate charge parameter meets the requirements of the chip specification, and the impact of this parameter on the chip performance (such as switching speed, switching loss, etc.) .

Different models of WUXI NCE POWER chips may differ in specific measurement details, so before measurement, be sure to carefully read the specifications of the chip and the operation manual of the test equipment to ensure the accuracy and reliability of the measurement. If you are unfamiliar with or unsure of the measurement process, it is recommended to consult a professional electronic engineer or relevant technician.